Bremen, Germany

Udo Meyer

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Udo Meyer. Retrieved from https://idiyas.com/inventor/udo-meyer-k90mx6by

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Udo Meyer: Innovator in Microstructurization Quality Testing

Introduction

Udo Meyer is a notable inventor based in Bremen, Germany. He has made significant contributions to the field of microstructurization quality testing. His innovative approach has led to the development of a unique device that enhances the accuracy of surface quality assessments.

Latest Patents

Udo Meyer holds a patent for a "Device for testing the quality of microstructurization." This device is designed to evaluate the quality of microstructurization of a surface with a known target microstructurization quality. It comprises a radiation source for coherent radiation, a first detector, a second detector, and a masking system. The arrangement allows the radiation emitted by the source to produce a diffraction pattern, which is crucial for determining surface quality.

Career Highlights

Udo Meyer is associated with the Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., a leading research organization in applied sciences. His work has been instrumental in advancing technologies related to microstructurization. He has a patent that showcases his expertise and innovative thinking in this specialized field.

Collaborations

Udo Meyer collaborates with talented individuals such as Susanne Markus and Stefan Dieckhoff. Their combined efforts contribute to the success of projects within the Fraunhofer-Gesellschaft.

Conclusion

Udo Meyer is a distinguished inventor whose work in microstructurization quality testing has made a significant impact. His innovative device and collaborations highlight his commitment to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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