Taichung, Taiwan

Tzu-Chieh Wei

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tzu-Chieh Wei. Retrieved from https://idiyas.com/inventor/tzu-chieh-wei-tkjwvhyf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Tzu-Chieh Wei: Innovator in Semiconductor Detection

Introduction

Tzu-Chieh Wei is a prominent inventor based in Taichung, Taiwan. He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for detecting defects in semiconductor devices.

Latest Patents

Tzu-Chieh Wei holds 1 patent for his invention titled "Method and system for detecting semiconductor device." This patent describes a comprehensive method that includes obtaining an image of the semiconductor device, evaluating features of the image, detecting defects based on these features, extracting defect information, calculating a defect die ratio (DDR), and analyzing the relationship between the DDR and the defect information.

Career Highlights

Wei is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work focuses on enhancing the reliability and efficiency of semiconductor devices through innovative detection methods.

Collaborations

Some of his notable coworkers include Fan Hu and Wen-Chuan Tai, who contribute to the collaborative efforts in advancing semiconductor technology.

Conclusion

Tzu-Chieh Wei's contributions to semiconductor detection exemplify the importance of innovation in technology. His work not only enhances the quality of semiconductor devices but also sets a benchmark for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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