This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Institute of Nuclear Energy Research. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: Tzong-Daw Wu and Thin-Film Measurement Innovation.
Introduction
Tzong-Daw Wu is an inventor associated with Taoyuan, Taiwan, and the Institute of Nuclear Energy Research. His patent work includes a method and system for measuring the thickness of thin films using artificial neural networks and spectral data.
Latest Patents
Wu is named on 1 patent: “Method and System for Measuring Thickness of Thin Film.” The invention uses a training database containing modified spectra paired with corresponding film thicknesses to train an artificial neural network. A spectrum measured from a coated sample is then processed by the trained network to estimate the film’s thickness. The related system includes a measuring unit, a spectrometer, and a processing unit.
Career Highlights
Wu’s documented patent contribution applies machine learning to thin-film measurement, using spectral analysis to estimate coating thickness. His work is associated with the Institute of Nuclear Energy Research.
Collaborations
Wu’s listed coworkers include Cheng-Chang Hsieh and Jiun-Shen Chen.
Conclusion
Tzong-Daw Wu’s patent describes an artificial-neural-network approach to estimating thin-film thickness from measured spectra, connecting his work at the Institute of Nuclear Energy Research with a practical measurement innovation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile