Malden, MA, United States of America

Tung L Ng

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Teradyne, Inc.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tung L Ng. Retrieved from https://idiyas.com/inventor/tung-l-ng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Innovations by Tung L Ng

Introduction

Tung L Ng is an accomplished inventor based in Malden, MA (US). He has made significant contributions to the field of electronic apparatuses, particularly in the area of serial bus testing. His innovative approach has led to the development of a unique patent that enhances the efficiency of testing equipment.

Latest Patents

Tung L Ng holds a patent titled "Universal approach for simulating, emulating, and testing a variety of serial bus types." This invention employs a generic bus model that breaks down a serial bus into separate layers managed by distinct processors. These processors can be programmed to communicate via one type of serial bus or reprogrammed for another, showcasing versatility in testing methodologies. He has 1 patent to his name.

Career Highlights

Tung L Ng is currently employed at Teradyne, Inc., a company known for its advanced testing solutions. His work at Teradyne has allowed him to apply his innovative ideas in a practical setting, contributing to the company's reputation for excellence in electronic testing.

Collaborations

Throughout his career, Tung has collaborated with notable colleagues, including Eric Lenhart Truebenbach and Michael Francis McGoldrick. These collaborations have fostered a creative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Tung L Ng's contributions to the field of electronic testing through his innovative patent demonstrate his expertise and commitment to advancing technology. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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