Osaka, Japan

Tsuyoshi Suenaga

USPTO Granted Patents = 2 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2018-2020

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2 patents (USPTO):Explore Patents

Title: Tsuyoshi Suenaga: Innovator in Shape Measurement Technology

Introduction

Tsuyoshi Suenaga is a prominent inventor based in Osaka, Japan. He has made significant contributions to the field of optical measurement technology. With a total of 2 patents, Suenaga's work focuses on enhancing the accuracy and efficiency of shape measurement and image inspection devices.

Latest Patents

Suenaga's latest patents include a shape measuring device and a shape measuring method. The shape measuring device features an optical-axis-direction driving section that allows for minute relative displacement of a stage in the optical axis direction. This innovation enables a phase shift of a projection pattern on the stage at a pitch finer than the width of the projected pattern. Additionally, he has developed an image inspection device, method, and program that facilitate easy and accurate inspection of shapes. This system registers positioning image data in a setting mode and displays it during inspection, allowing for precise measurements and determination of Pass/Fail results.

Career Highlights

Tsuyoshi Suenaga is currently employed at Keyence Corporation, a leading company in automation and measurement technology. His work at Keyence has allowed him to push the boundaries of optical measurement and inspection technologies.

Collaborations

Suenaga collaborates with Shinya Takahashi, contributing to advancements in their respective fields. Their teamwork exemplifies the importance of collaboration in driving innovation.

Conclusion

Tsuyoshi Suenaga's contributions to shape measurement technology and image inspection are noteworthy. His patents reflect a commitment to improving measurement accuracy and efficiency. Through his work at Keyence Corporation, he continues to influence the field of optical measurement technology.

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