Tsuyoshi Oonishi

Title: Tsuyoshi Oonishi and His Focused Ion Beam Innovations.

Introduction

Tsuyoshi Oonishi is an inventor based in Tokyo, Japan, whose patent work includes technologies for focused ion beam apparatuses and sample handling. His listed portfolio includes 3 patents. He is associated with Hitachi High-Tech Science Corporation.

Latest Patents

Oonishi’s listed patents address focused ion beam equipment and the precise preparation and transfer of microscopic samples.

“Focused ion beam apparatus” describes a system that uses a focused ion beam to obtain a micro sample-piece. The apparatus includes a sample tray, a sample chamber, a side-entry carrier, and a unit that moves the sample-piece between the tray and carrier. The tray can move along the x, y, and z axes, and a releasable engagement part allows its movement to carry the carrier along with it.

“Sample holder and focused ion beam apparatus” concerns a mesh support member with shaft members extending toward beam members. At least one shaft includes a through hole that provides a path for a focused ion beam to reach a fine sample-piece.

Career Highlights

The available information connects Oonishi’s patent activity with Hitachi High-Tech Science Corporation and highlights his work on focused ion beam apparatuses, sample holders, and micro-sample handling. These technologies support the preparation and positioning of small samples for analysis.

Collaborations

Oonishi’s listed coworkers include Toshiyuki Iwahori and Satoshi Tomimatsu. The provided information does not specify their roles in the patents or the nature of their collaboration.

Conclusion

Tsuyoshi Oonishi’s listed inventions focus on improving focused ion beam equipment and the handling of fine samples, reflecting a specialized contribution to precision instrumentation.