Tsutomu Tatematsu

Title: Tsutomu Tatematsu: Innovator in Semiconductor Testing Technology

Introduction

Tsutomu Tatematsu is a notable inventor based in Kuwana, Japan. He has made significant contributions to the field of semiconductor testing technology. With a total of two patents to his name, Tatematsu has demonstrated his expertise and innovative spirit in the industry.

Latest Patents

Tatematsu's latest patents include a probe card with a cantilever-type probe and a semiconductor device equipped with a fuse. The probe card is designed to test electronic devices and features a base plate with a cantilever-type probe that moves upon contact with the tested body. A stopper on the base plate restricts the movement of the probe, ensuring accurate testing. His second patent involves a high-strength protective member made of tungsten, which is strategically placed under the disconnecting point of a fuse. This protective member is formed simultaneously with the via contact portion that connects the fuse to the wiring.

Career Highlights

Tsutomu Tatematsu is currently employed at Fujitsu Corporation, where he continues to innovate and contribute to advancements in semiconductor technology. His work has been instrumental in enhancing the reliability and efficiency of electronic device testing.

Collaborations

Tatematsu has collaborated with notable colleagues, including Yoshikazu Arisaka and Kengi Togashi. Their combined expertise has fostered a productive environment for innovation within their field.

Conclusion

Tsutomu Tatematsu is a distinguished inventor whose work in semiconductor testing technology has led to significant advancements. His patents reflect his commitment to innovation and excellence in the industry.