The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2007
Filed:
Oct. 31, 2002
Tsutomu Tatematsu, Kuwana, JP;
Kenji Togashi, Kawasaki, JP;
Tetsuhiro Nanbu, Kawasaki, JP;
Shigenobu Ishihara, Kawasaki, JP;
Morihiko Hamada, Kawasaki, JP;
Yoshikazu Arisaka, Kawasaki, JP;
Kunihiro Itagaki, Kawasaki, JP;
Shigekazu Aoki, Kawasaki, JP;
Tsutomu Tatematsu, Kuwana, JP;
Kenji Togashi, Kawasaki, JP;
Tetsuhiro Nanbu, Kawasaki, JP;
Shigenobu Ishihara, Kawasaki, JP;
Morihiko Hamada, Kawasaki, JP;
Yoshikazu Arisaka, Kawasaki, JP;
Kunihiro Itagaki, Kawasaki, JP;
Shigekazu Aoki, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A probe card is used to test an electronic device. The probe card includes a base plate and a cantilever-type probe arranged on the base plate. The cantilever-type probe has an end that contacts the contacted body and moves when contacting the contacted body. A stopper arranged on the base plate restricts the movement of the cantilever-type probe.