Minamiashigara, Japan

Tsutomu Tanaka

This inventor holds 1 USPTO granted patent. Top assignee: Fujifilm Corporation. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsutomu Tanaka. Retrieved from https://idiyas.com/inventor/tsutomu-tanaka-mi5maxhj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Tsutomu Tanaka: Innovator in Automatic Analysis Technology

Introduction

Tsutomu Tanaka is a notable inventor based in Minamiashigara, Japan. He has made significant contributions to the field of automatic analysis technology, particularly through his innovative patent that enhances operational reliability in analysis apparatuses.

Latest Patents

Tanaka holds a patent for an "Automatic analysis apparatus." This invention addresses the issue of dry analysis elements projecting from an element cartridge during operation. The design includes a correcting means, such as a restricting projection, which ensures that the element is returned to its proper position, thereby preventing conveyance failure and information readout failure. This innovation significantly enhances the reliability of automatic analysis operations.

Career Highlights

Tsutomu Tanaka is associated with Fujifilm Corporation, where he has been instrumental in developing advanced technologies in the field of analysis. His work has contributed to the company's reputation for innovation and quality in analytical equipment.

Collaborations

Tanaka has collaborated with notable colleagues, including Tomoyuki Takiue and Yoshihiro Seto. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

In summary, Tsutomu Tanaka is a distinguished inventor whose work in automatic analysis technology has led to significant advancements in operational reliability. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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