The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2007

Filed:

Jan. 13, 2004
Applicants:

Yoshihiro Seto, Minamiashigara, JP;

Tomoyuki Takiue, Minamiashigara, JP;

Tsutomu Tanaka, Minamiashigara, JP;

Katsumi Suzuki, Minamiashigara, JP;

Inventors:

Yoshihiro Seto, Minamiashigara, JP;

Tomoyuki Takiue, Minamiashigara, JP;

Tsutomu Tanaka, Minamiashigara, JP;

Katsumi Suzuki, Minamiashigara, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

When a dry analysis element contained in an element cartridge to be loaded in a sample tray of an automatic analysis apparatus projects from a take out port, the element is returned to its proper position, thereby preventing conveyance failure and information readout failure, with the result that higher operation reliability is ensured. An element mounting portion is equipped with a correcting means, such as a restricting projection. The correcting means contacts and pushes a dry analysis element which projects from an element cartridge back to its predetermined position therein, in association with a loading operation of the element cartridge.


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