Minamiashigara, Japan

Tomoyuki Takiue

This inventor holds 1 USPTO granted patent. Top assignee: Fujifilm Corporation. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tomoyuki Takiue. Retrieved from https://idiyas.com/inventor/tomoyuki-takiue-utrt0cys

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: The Innovations of Tomoyuki Takiue

Introduction

Tomoyuki Takiue is a notable inventor based in Minamiashigara, Japan. He has made significant contributions to the field of automatic analysis apparatuses. His work focuses on enhancing the reliability and efficiency of these devices.

Latest Patents

Takiue holds a patent for an automatic analysis apparatus. This invention addresses the issue of dry analysis elements projecting from an element cartridge during operation. The design includes a correcting means that ensures the element is returned to its proper position, thereby preventing conveyance failure and information readout failure. This innovation significantly enhances the operational reliability of the apparatus.

Career Highlights

Takiue is associated with Fujifilm Corporation, where he applies his expertise in developing advanced analytical technologies. His work has contributed to the company's reputation for innovation in the field of imaging and analysis.

Collaborations

He has collaborated with notable coworkers, including Yoshihiro Seto and Tsutomu Tanaka. Their combined efforts have led to advancements in the technology used in automatic analysis systems.

Conclusion

Tomoyuki Takiue's contributions to the field of automatic analysis apparatuses exemplify the importance of innovation in technology. His patent reflects a commitment to improving operational reliability in analytical devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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