Kodaira, Japan

Tsutomu Okabe


Average Co-Inventor Count = 12.2

ph-index = 4

Forward Citations = 65(Granted Patents)


Company Filing History:


Years Active: 1996-2003

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7 patents (USPTO):Explore Patents

Title: Tsutomu Okabe: Innovator in Data Analysis Systems

Introduction

Tsutomu Okabe is a prominent inventor based in Kodaira, Japan. He has made significant contributions to the field of data analysis systems, particularly in the context of inspection technologies. With a total of seven patents to his name, Okabe's work has had a substantial impact on the industry.

Latest Patents

One of Okabe's latest patents is an inspection data analyzing system. This invention provides data analysis stations for both a probing tester and an automatic particle inspection machine. The system ensures that the coordinates describing the disposition of chips on a product basis are aligned with the locations of defects. Additionally, the station has the capability to determine which chips each defect belongs to. These data analysis stations are interconnected through a communication line, allowing for comprehensive data analysis on a chip basis. This innovation enables a better understanding of the relationship between defect causes and the product characteristics of each chip.

Career Highlights

Tsutomu Okabe has had a distinguished career at Hitachi, Ltd., where he has been instrumental in developing advanced technologies. His expertise in data analysis and inspection systems has positioned him as a key figure in the company. His contributions have not only advanced the company's technological capabilities but have also set new standards in the industry.

Collaborations

Throughout his career, Okabe has collaborated with notable colleagues, including Seiji Ishikawa and Masao Sakata. These partnerships have fostered innovation and have led to the successful development of various projects within Hitachi, Ltd.

Conclusion

In summary, Tsutomu Okabe is a notable inventor whose work in data analysis systems has significantly influenced the field of inspection technologies. His innovative patents and contributions to Hitachi, Ltd. highlight his importance in advancing industry standards.

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