This inventor holds 1 USPTO granted patent. Top assignee: Agency of Industrial Science and Technology. Active years: 1991.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1991
Title: Tsuneo Kikuchi: Innovator in Ultrasonic Measurement Technology
Introduction: Tsuneo Kikuchi is a notable inventor based in Tsukuba, Japan. He has made significant contributions to the field of ultrasonic measurement technology. His innovative approach has led to advancements in understanding spatial distributions in scattering media.
Latest Patents: Tsuneo Kikuchi holds a patent for a method and apparatus for measuring the spatial distribution of spacings between point scatterers. The patent, titled "Measuring spatial distribution of spacings between point scatterers," describes a process where ultrasonic waves are applied to a medium composed of point scatterers. The scattered ultrasonic waves are converted into an electric signal, allowing for the determination of the power spectrum shape. A fractal analysis is then performed to ascertain the fractal dimension and self-similarity of the power spectrum shape. This method enables the measurement of the spatial distribution of structural inhomogeneity within the scattering medium.
Career Highlights: Tsuneo Kikuchi is affiliated with the Agency of Industrial Science and Technology, where he has been instrumental in developing innovative measurement techniques. His work has garnered attention for its practical applications in various scientific fields.
Collaborations: Tsuneo Kikuchi has collaborated with Shogo Kiryu, contributing to advancements in their shared field of research. Their partnership has fostered innovative solutions and enhanced the understanding of ultrasonic measurement technologies.
Conclusion: Tsuneo Kikuchi's contributions to ultrasonic measurement technology exemplify the impact of innovative thinking in scientific research. His patent and collaborative efforts continue to influence the field, showcasing the importance of advancements in measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
