The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 1991
Filed:
Mar. 23, 1990
Applicant:
Inventors:
Tsuneo Kikuchi, Tsukuba, JP;
Shogo Kiryu, Tsukuba, JP;
Assignee:
Agency of Industrial Science and Technology, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73602 ; 12866103 ; 36441325 ;
Abstract
Method of and apparatus for measuring a space distribution of spacings between point scatterers. An ultrasonic wave is applied to an ultrasonic scattering medium which is an aggregation of point scatterers. Ultrasonic waves, scattered from the medium, are converted into an electric signal. The shape of a power spectrum of the electric signal is determined. A fractal analysis is effected so as to determine a fractal dimension and self-similarity with respect to the power spectrum shape. A spatial distribution of a structural inhomogeneity of the scattering medium is measured in accordance with results of the fractal analysis.