Kagoshima, Japan

Tsuguo Sakiyama

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 1991.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 19(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Tsuguo Sakiyama: Innovator in Semiconductor Technology

Introduction

Tsuguo Sakiyama is a notable inventor based in Kagoshima, Japan. He has made significant contributions to the field of semiconductor technology, particularly in methods for attaching semiconductors to transparent substrates. His innovative approach has the potential to enhance the efficiency and reliability of semiconductor devices.

Latest Patents

Sakiyama holds a patent for a method of fabricating semiconductor devices. This method involves pressing first and second semiconductor devices against a transparent board at different times using separate pressure tools. This unique approach allows for the absorption of differences in thickness and deflection between the devices, ensuring a reliable electrical connection between the electrodes and conductors. His patent enables the continuous achievement of a highly dense assembly of semiconductor devices with minimal gaps.

Career Highlights

Tsuguo Sakiyama is associated with Matsushita Electric Industrial Co., Ltd., a company known for its advancements in electronics and technology. His work has contributed to the development of more efficient semiconductor devices, which are crucial in various electronic applications.

Collaborations

Sakiyama has collaborated with notable colleagues, including Hiroaki Fujimoto and Kenzou Hatada. Their combined expertise has likely fostered innovative solutions in the semiconductor field.

Conclusion

Tsuguo Sakiyama's contributions to semiconductor technology through his patented methods demonstrate his commitment to innovation. His work continues to influence the development of advanced electronic devices.

Profile summary based on public USPTO records.
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