Tampa, FL, United States of America

Troi Williams

This inventor holds 1 USPTO granted patent. Top assignee: University of South Florida. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Troi Williams. Retrieved from https://idiyas.com/inventor/troi-williams

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Troi Williams: Innovator in Sensor Measurement Models

Introduction

Troi Williams is a notable inventor based in Tampa, FL (US). He has made significant contributions to the field of sensor measurement models, particularly in localization technologies. His innovative work has the potential to enhance the accuracy and reliability of sensor data.

Latest Patents

Troi Williams holds a patent titled "Learning state-dependent sensor measurement models for localization." This patent addresses the determination of noise and bias for sensors. The invention involves receiving an input vector and generating a parameter vector based on a feed-forward neural network. Additionally, it includes determining components using the parameter vector based on a mixture model. A conditional probability density function is generated, which is crucial for improving sensor measurement accuracy.

Career Highlights

Troi Williams is affiliated with the University of South Florida, where he contributes to research and development in sensor technologies. His work is instrumental in advancing the understanding of sensor behavior and improving localization methods.

Collaborations

Troi collaborates with Yu Sun, a talented researcher in the field. Their partnership enhances the research output and fosters innovation in sensor measurement technologies.

Conclusion

Troi Williams is a pioneering inventor whose work in sensor measurement models is shaping the future of localization technologies. His contributions are vital for the advancement of accurate sensor data interpretation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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