The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Dec. 31, 2018
Applicants:
Yu Sun, Tampa, FL (US);
Troi Williams, Tampa, FL (US);
Inventors:
Yu Sun, Tampa, FL (US);
Troi Williams, Tampa, FL (US);
Assignee:
University of South Florida, Tampa, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/0454 (2013.01); G06N 7/005 (2013.01);
Abstract
A noise and bias can be determined for a sensor. An input vector can be received. A parameter vector can be generated based at least in part on a feed-forward neural network. Components can be determined using the parameter vector based at least in part on a mixture model. A conditional probability density function can be generated based at least in part on the conditional probability density function.
Sun, Yu. (2020). Learning state-dependent sensor measurement models for localization (U.S. Patent No. 10572802). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10572802
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile