Munich, Germany

Trevor Charles Jones

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Texas Instruments Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Trevor Charles Jones. Retrieved from https://idiyas.com/inventor/trevor-charles-jones

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Trevor Charles Jones

Introduction

Trevor Charles Jones is a notable inventor based in Munich, Germany. He has made significant contributions to the field of memory systems, showcasing his expertise through his innovative patent.

Latest Patents

Trevor holds a patent for a "Multilevel memory system with copied error detection bits." This invention describes a memory system that is accessed by reading a data line and error detection bits from a first memory. The system decodes the data line and error detection bits to determine if an error is present. Additionally, a copy of the data line and error detection bits is stored in a second memory, which is also decoded to check for errors. This innovative approach enhances the reliability of memory systems.

Career Highlights

Trevor is currently employed at Texas Instruments Corporation, where he continues to develop cutting-edge technologies. His work focuses on improving memory systems, which are crucial for various applications in electronics and computing.

Collaborations

Trevor collaborates with talented coworkers, including Ruchi Shankar and Tejas Dhanajirao Salunkhe. Their combined expertise fosters a creative environment that drives innovation within their projects.

Conclusion

Trevor Charles Jones exemplifies the spirit of innovation through his contributions to memory systems. His patent reflects a commitment to enhancing technology and improving data reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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