The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Dec. 21, 2021
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Ruchi Shankar, Bengaluru, IN;

Tejas Dhanajirao Salunkhe, Bengaluru, IN;

Trevor Charles Jones, Mainburg-Meilenhofen, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 12/08 (2016.01); G06F 12/0811 (2016.01);
U.S. Cl.
CPC ...
G06F 11/1064 (2013.01); G06F 11/0772 (2013.01); G06F 11/1048 (2013.01); G06F 12/0811 (2013.01);
Abstract

In described examples, a memory system is accessed by reading a data line and error detection bits for the data line from a first memory. The data line and the error detection bits from the first memory are decoded to determine if an error is present in the data line from the first memory. A copy of the data line and the error detection bits are stored in a second memory. The copy of the data line and error detection bits are read from the second memory. The copy of the data line and error detection bits are decoded to determine if an error is present in the copy of the data line from the second memory.


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