Fremont, CA, United States of America

Travis Clark Mazzy

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Applied Materials, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Travis Clark Mazzy. Retrieved from https://idiyas.com/inventor/travis-clark-mazzy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Travis Clark Mazzy and Gas Distribution System Monitoring

Introduction

Travis Clark Mazzy is an inventor based in Fremont, California, and is associated with Applied Materials, Inc. His patent work includes a system for detecting malfunctions in gas distribution systems.

Latest Patents

Mazzy is named on 1 patent: “Systems and Methods for Detecting Malfunctions Within a Gas Distribution System.” The invention describes enabling gas flow through a system’s flow path and collecting pressure and/or flow-rate data. A controller processes the data to determine whether a malfunction is present and, if so, estimates its location relative to a mass flow controller or sensor. The system can then generate a report identifying the malfunction and its relative location.

Career Highlights

Mazzy’s patent reflects work on monitoring and diagnosing gas distribution systems. By using flow and pressure measurements to identify potential malfunctions and estimate their locations, the disclosed approach can support more targeted system troubleshooting.

Collaborations

Mazzy’s listed coworkers include Daemian Raj Benjamin Raj and Hassan Ali. His association with Applied Materials, Inc. provides organizational context for his patent work.

Conclusion

Travis Clark Mazzy’s patent focuses on detecting and locating malfunctions in gas distribution systems through data-driven monitoring, offering a practical approach to system diagnosis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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