Tran Kononova

Title: Tran Kononova: Innovator in Wafer Testing Technology

Introduction

Tran Kononova is a prominent inventor based in San Diego, California. She has made significant contributions to the field of integrated circuit fabrication, particularly in wafer testing technology. Her innovative approach addresses critical challenges in the industry, showcasing her expertise and dedication to advancing technology.

Latest Patents

Tran holds a patent for "PCM metal shielding for wafer testing." This invention presents methods and devices designed to reduce yield loss during the integrated circuit fabrication process. The patent specifically focuses on minimizing undesired interactions between phase change materials (PCMs) and wafer test probes during sorting tests. The methods involve using a properly patterned metal layer on the PCM dies adjacent to the product dies under test. These patterned metal layers effectively shield the traces of the wafer probes from the circuits of the PCM dies, enhancing the reliability of the testing process.

Career Highlights

Tran is currently employed at Psemi Corporation, where she continues to innovate and develop solutions in the semiconductor industry. Her work has been instrumental in improving the efficiency and effectiveness of wafer testing processes. With her extensive knowledge and experience, she has become a valuable asset to her team and the company.

Collaborations

Tran collaborates with talented individuals such as Jacob Hamilton and Jay Kothari. Together, they work on various projects that aim to push the boundaries of technology in their field.

Conclusion

Tran Kononova's contributions to wafer testing technology exemplify her commitment to innovation and excellence. Her patent and ongoing work at Psemi Corporation highlight her role as a leading inventor in the semiconductor industry.