Katsuta, Japan

Toshiyuki Ohhashi

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshiyuki Ohhashi. Retrieved from https://idiyas.com/inventor/toshiyuki-ohhashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Toshiyuki Ohhashi: Inventor in Electron-Beam Positioning

Introduction

Toshiyuki Ohhashi is an inventor associated with Katsuta, Japan, and Hitachi, Ltd. His recorded patent work concerns a method for positioning electron-beam irradiation using an image of the specimen.

Latest Patents

Ohhashi is credited with 1 patent: “Method of Determining the Position of Electron Beam Irradiation.” The invention describes irradiating a desired portion of a specimen with an electron beam and forming an image of the beam as it passes through the specimen onto a fluorescent screen. The beam’s position is then determined using an image obtained by scanning across an area wider than the beam spot on the specimen’s surface.

Career Highlights

The available information associates Ohhashi’s invention with Hitachi, Ltd. The patent focuses on a practical approach to locating electron-beam irradiation on a specimen.

Collaborations

Hiroyuki Kobayashi and Kazuo Shii are identified as Ohhashi’s coworkers.

Conclusion

Toshiyuki Ohhashi’s recorded patent highlights a technique for positioning electron-beam irradiation through specimen imaging, reflecting his association with Hitachi, Ltd.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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