Hyogo, Japan

Toshiya Murota

This inventor holds 2 USPTO granted patents. Top assignee: Ricoh Company, Ltd.. Active years: 1998-2011.


% Patents Active = 50.0

Average Co-Inventor Count = 4.2

ph-index = 1

Forward Citations = 2(Granted Patents)


Location History:

  • Kawanishi, JP (1998)
  • Hyogo, JP (2011)

Company Filing History:


Years Active: 1998-2011

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2 patents (USPTO):Explore Patents

Title: Toshiya Murota: Innovator in Power Supply and Integrated Circuit Testing

Introduction

Toshiya Murota is a notable inventor based in Hyogo, Japan. He has made significant contributions to the fields of power supply circuits and integrated circuit testing. With a total of 2 patents to his name, Murota continues to push the boundaries of innovation in his field.

Latest Patents

Murota's latest patents include a "Switching Power Supply Circuit" and a "Method of Finding DC Test Point of an Integrated Circuit." The switching power supply circuit is designed to generate an output voltage based on an input voltage, featuring a reference voltage generating circuit that ensures controlled voltage rise rates during the initial start-up period. The method for finding a DC test point involves displaying a list of input and output terminals of an integrated circuit, allowing for the selection of terminals and test patterns to identify the DC test point effectively.

Career Highlights

Toshiya Murota is currently employed at Ricoh Company, Ltd., where he applies his expertise in developing innovative solutions. His work has been instrumental in enhancing the efficiency and reliability of electronic devices.

Collaborations

Murota has collaborated with notable coworkers, including Katsuhisa Furuse and Masanobu Fukushima. Their combined efforts contribute to the advancement of technology in their respective fields.

Conclusion

Toshiya Murota stands out as an influential inventor in the realm of power supply and integrated circuit testing. His patents reflect a commitment to innovation and excellence in technology.

Profile summary based on public USPTO records.
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