The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 1998
Filed:
Jun. 25, 1996
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A DC test point finding method includes steps of: displaying a list of all input and output terminals of an integrated circuit; inputting selected terminals among the terminals of the list; inputting a selected test pattern file among a number of stored test pattern files, each test pattern file including a plurality of sequentially occurred test vectors and identified by a name of the test pattern file, the test vectors identified by respective vector numbers; inputting a test point finding condition related to a DC test point; finding the DC test point of the circuit among the selected terminals by using the test vectors of the selected test pattern file and the test point finding condition; and inserting test point data of the DC test point into the list so that the resulting list including the test point data is displayed.