Kobe, Japan

Toshio Sakuragi

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Denki Kabushiki Kaisha. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshio Sakuragi. Retrieved from https://idiyas.com/inventor/toshio-sakuragi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: The Innovations of Toshio Sakuragi

Introduction

Toshio Sakuragi is a notable inventor based in Kobe, Japan. He has made significant contributions to the field of automatic flaw detection technology. His innovative approach has led to the development of a unique device that enhances the inspection process of materials.

Latest Patents

Sakuragi holds a patent for an "Automatic Flaw Detection Device." This apparatus consists of a supporting frame and a hollow shaft that is freely rotatable. The device is designed to inspect materials as they pass through the hollow shaft. It includes a holder that rotates in association with the shaft and incorporates sensing means to detect any defects in the material. Additionally, a signal transmission device is used to relay the flaw detection signals to the outside.

Career Highlights

Toshio Sakuragi is associated with Mitsubishi Electric Corporation, where he has applied his expertise in developing advanced technologies. His work has been instrumental in improving the efficiency and accuracy of flaw detection in various materials.

Collaborations

Sakuragi has collaborated with notable colleagues, including Kazuo Nakayama and Mitsuhiro Koike. Their combined efforts have contributed to the advancement of technology in their field.

Conclusion

Toshio Sakuragi's contributions to automatic flaw detection technology exemplify the impact of innovation in engineering. His patent and collaborative efforts continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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