The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 1985
Filed:
Mar. 16, 1984
Toshio Sakuragi, Kobe, JP;
Kazuo Nakayama, Hyogo, JP;
Masaaki Sato, Kamakura, JP;
Mitsuhiro Koike, Yokohama, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
An automatic flaw detection apparatus comprises a supporting frame; a hollow shaft which is supported on said frame in a freely rotatable manner through a bearing, and through the interior of which passes a material to be inspected; a holder disposed within said hollow shaft, and extending in the longitudinal direction of the axis of said hollow shaft, and rotating in association with said hollow shaft; sensing means incorporated in said holder to detect any defect in said material to be probed; and a signal transmission device interposed between said hollow shaft and said supporting frame, and to transmit the flaw detection signal from said sensor means to outside.