This inventor holds 27 USPTO granted patents, primarily in Optical Scanning Technology. Top assignees: Minolta Company, Ltd., Minolta Camera Kabushiki Kaisha, Konica Minolta Business Technologies, Inc.. Active years: 1990-2008.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshio Naiki. Retrieved from https://idiyas.com/inventor/toshio-naiki
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 96.3
Average Co-Inventor Count = 2.0
ph-index = 8
Forward Citations = 190(Granted Patents)
Location History:
- Osaka, JP (1990 - 1992)
- Toyohashi, JP (1992 - 1994)
- Toyokawa, JP (1994 - 2008)
Company Filing History:

Minolta Company, Ltd.
Minolta Camera Kabushiki Kaisha

Konica Minolta Business Technologies, Inc.
Years Active: 1990-2008
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Areas of Expertise:
Optical Apparatus
Laser Beam Scanning
Diffraction Optical Device
Multi-Beam Scanning
Light Source Device
Image Forming
Laser Diode Array
Lens Holding
Scanning Optical System
Acoustooptic Element
Optical Lens
Beam Position Sensor
27 patents (USPTO):Explore Patents
Couldn't find inventor
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshio Naiki. Retrieved from https://idiyas.com/inventor/toshio-naiki
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]