The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 1999
Filed:
Oct. 10, 1997
Applicant:
Inventors:
Hiromu Nakamura, Toyokawa, JP;
Toshio Naiki, Toyokawa, JP;
Etsuko Shibata, Toyohashi, JP;
Satoru Ono, Toyokawa, JP;
Assignee:
Minolta Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359206 ; 205207 ; 205216 ; 205662 ;
Abstract
A scanning apparatus has a luminous flux deflector and a single f.theta. lens. The deflector deflects a convergent luminous flux on a scanned surface at a uniform angular velocity. The f.theta. lens is arranged between the deflector and the scanned surface. The f.theta. lens is bi-convex in a main scanning direction and is made of a material having a refractive index of at most 1.6. One surface of the f.theta. lens in a main scanning direction is so curved that a radius of curvature in the main scanning direction A decreases as an angle of view in the main scanning direction increases.