This inventor holds 24 USPTO granted patents, primarily in Optical Scanning Systems. Top assignees: Minolta Company, Ltd., Minolta Camera Kabushiki Kaisha, Konica Minolta Business Technologies, Inc.. Active years: 1986-2008.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiromu Nakamura. Retrieved from https://idiyas.com/inventor/hiromu-nakamura
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 95.8
Average Co-Inventor Count = 2.9
ph-index = 8
Forward Citations = 148(Granted Patents)
Company Filing History:
12 out of 2,816 
Minolta Company, Ltd.
11 out of 2,979 Minolta Camera Kabushiki Kaisha
1 out of 2,526 
Konica Minolta Business Technologies, Inc.
Years Active: 1986-2008
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Areas of Expertise:
Optical Beam Scanning
Laser Beam Scanning
Image Forming Apparatus
Scanning Lens System
Polygonal Mirror
Optical Device
F.theta. Mirror
Beam Scanning Optical System
Laser Printing
Optical Element
Slit Exposure
24 patents (USPTO):Explore Patents
Couldn't find inventor
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiromu Nakamura. Retrieved from https://idiyas.com/inventor/hiromu-nakamura
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]