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For the Inventor, By the Inventor

Inagi, Japan

Toshinori Ando

This inventor holds 16 USPTO granted patents and 2 published patent applications. Top assignee: Canon Kabushiki Kaisha. Active years: 1987-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshinori Ando. Retrieved from https://idiyas.com/inventor/toshinori-ando

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 16 

% Patents Active = 81.3

Average Co-Inventor Count = 1.4

ph-index = 9

Forward Citations = 164(Granted Patents)


Location History:

  • Yokohama, JP (1987 - 1997)
  • Tochigi, JP (2006)
  • Inagi, JP (1996 - 2018)

Company Filing History:

goldMedal16 out of 93,085 
 
Canon Kabushiki Kaisha
 patents

Years Active: 1987-2018

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16 patents (USPTO):Explore Patents
1. 10066934 - Three-dimensional shape measuring apparatus and control method thereof (2018-09-04),
2. 9036139 - Optical characteristic measurement apparatus (2015-05-19),
3. 8659765 - Three-dimensional shape determining apparatus and three-dimensional shape determining method (2014-02-25),
4. 7034972 - Optical scanning device and image forming apparatus using the optical scanning device (2006-04-25),
5. 6091532 - Optical element, method of molding the same, and laser scanning optical (2000-07-18),
6. 5991063 - Optical scanning device (1999-11-23),
7. 5680242 - Scanning optical apparatus (1997-10-21),
8. 5549855 - Optical element molding method (1996-08-27),
9. 5323183 - Image recording apparatus (1994-06-21),
10. 5241174 - Scanning optical apparatus having imaging position adjusting means (1993-08-31),
11. 5153609 - Image forming apparatus (1992-10-06),
12. 5138479 - Light beam scanning apparatus and method of detecting a variation of a (1992-08-11),
13. 5122658 - Scanning optical apparatus having focus position adjusting means (1992-06-16),
14. 4698511 - Document sheet size or position recognition device (1987-10-06),
15. 4674825 - Scanning optical system (1987-06-23),

Title: Innovations of Toshinori Ando

Introduction

Toshinori Ando is a prominent inventor based in Inagi, Japan. He has made significant contributions to the field of optical measurement technology, holding a total of 16 patents. His work focuses on enhancing precision and efficiency in three-dimensional shape measurement and optical characteristic measurement.

Latest Patents

One of his latest patents is a three-dimensional shape measuring apparatus and control method. This invention sets the exposure amount of specific patterns used in triangulation to be larger than that of other patterns. This adjustment reduces the influence of shot noise, thereby improving measurement precision and reducing overall power consumption. Another notable patent is an optical characteristic measurement apparatus. This device acquires measurement values related to the image characteristics of optical systems across multiple evaluation planes. It includes a measurement value correction unit that adjusts values pertaining to the width or light intensity of beam distributions, ensuring accurate optical measurements.

Career Highlights

Toshinori Ando is associated with Canon Kabushiki Kaisha, a leading company in imaging and optical products. His work at Canon has allowed him to develop innovative technologies that enhance the capabilities of optical systems. His inventions have contributed to advancements in various applications, including industrial and consumer imaging technologies.

Collaborations

Throughout his career, Ando has collaborated with notable colleagues such as Masamichi Tateoka and Hiroshi Nakanishi. These collaborations have fostered a creative environment that has led to the development of cutting-edge technologies in optical measurement.

Conclusion

Toshinori Ando's contributions to the field of optical measurement are significant and impactful. His innovative patents reflect his dedication to improving measurement precision and efficiency. His work continues to influence advancements in optical technology, making him a key figure in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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