The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Jun. 14, 2004
Toshinori Ando, Tochigi, JP;
Toshinori Ando, Tochigi, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An optical scanning device has an incident optical system that makes a light beam emitted from a light source unit enter to a deflection surface of an optical deflector in a state in which the light beam has a larger width than a width of the deflection surface in a main scanning direction, and an imaging optical system that images the light beam reflectively deflected by the optical deflector onto a surface to be scanned. In the device, a slit member that restricts a diameter of the light beam in a sub-scanning direction is provided within an optical path between the optical deflector and the surface to be scanned. A peak intensity of a spot of the light beam scanned on the surface to be scanned is made constant, or substantially constant across an entire effective scanning region. A dependence on an angle of view of the peak intensity of the spot in the scanning optical system can thus be reduced, in particular, minute printing across an entire effective scanning region can be obtained even in a high-speed optical scanning device using an overfilled scanning optical system.