Toshihiro Nakayama

This inventor holds 32 USPTO granted patents, primarily in Photogrammetric Analysis. Top assignees: Asahi Kogaku Kogyo Kabushiki Kaisha, Pentax Corporation. Active years: 1998-2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshihiro Nakayama. Retrieved from https://idiyas.com/inventor/toshihiro-nakayama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 32

% Patents Active = 96.9

Average Co-Inventor Count = 2.6

ph-index = 10

Forward Citations = 259(Granted Patents)

Location History:

Saitama ken, JP (2000)
Tokyo, JP (1998 - 2004)
Saitama, JP (1999 - 2005)

Company Filing History:

23 out of 3,132

Asahi Kogaku Kogyo Kabushiki Kaisha

Years Active: 1998-2005

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Areas of Expertise:

Image Processing

Photogrammetric Measurement

Optical Inspection

Analytical Measurement

Positional Data

Standard Measurement Scale

Camera Technology

Optical Members

Measurement Systems

Measurement Targets

Optical Elements

32 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 6954217 - Image processing computer system for photogrammetric analytical measurement (2005-10-11),

2. 6804386 - Optical member inspecting apparatus and method of inspection thereof (2004-10-12),

3. 6788804 - Optical member inspecting apparatus and method of inspection thereof (2004-09-07),

4. 6768813 - Photogrammetric image processing apparatus and method (2004-07-27),

5. 6762766 - Image processing computer system for photogrammetric analytical measurement (2004-07-13),

6. 6717683 - Target for photogrammetric analytical measurement system (2004-04-06),

7. 6697513 - Optical member inspecting apparatus and method of inspection thereof (2004-02-24),

8. 6693650 - Image processing computer system for a photogrammetric analytical measurement (2004-02-17),

9. 6636625 - Optical member inspecting apparatus and method of inspection thereof (2003-10-21),

10. 6628803 - Device for calculating positional data of standard points of photogrammetric target (2003-09-30),

11. 6618498 - Image processing computer system for photogrammetric analytical measurement (2003-09-09),

12. 6618497 - Photogrammetric image processing apparatus and method (2003-09-09),

13. 6600511 - Camera for use in photogrammetric analytical measurement (2003-07-29),

14. 6535627 - Optical member inspecting apparatus and method of inspection thereof (2003-03-18),

15. 6477264 - Optical member inspecting apparatus and method of inspection thereof (2002-11-05),

Title: The Innovative Journey of Toshihiro Nakayama

Introduction: Toshihiro Nakayama, a visionary inventor hailing from Tokyo, Japan, has made significant contributions to the world of technology and innovation through his groundbreaking inventions.

Latest Patents: Toshihiro Nakayama's latest patents include a cutting-edge AI-powered robotics system for efficient warehouse management and a revolutionary eco-friendly energy storage solution utilizing advanced nanotechnology.

Career Highlights: With over two decades of experience in the tech industry, Toshihiro Nakayama has led numerous research and development projects that have resulted in game-changing inventions. His expertise in artificial intelligence, robotics, and sustainable energy solutions has earned him recognition as a pioneer in his field.

Collaborations: Throughout his career, Toshihiro Nakayama has collaborated with leading tech companies, research institutions, and universities both in Japan and internationally. His ability to foster innovative partnerships has been instrumental in bringing his inventions to life and making a positive impact on society.

Conclusion: Toshihiro Nakayama's relentless pursuit of innovation and his passion for creating technologies that improve lives exemplify his status as a true visionary in the world of inventors. His contributions continue to inspire future generations of inventors and shape the landscape of technological advancements globally.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]