The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2004

Filed:

Jul. 06, 2000
Applicant:
Inventor:

Toshihiro Nakayama, Saitama, JP;

Assignee:

PENTAX Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 ;
U.S. Cl.
CPC ...
G09G 5/00 ;
Abstract

In an image processing computer system for a photogrammetric analytical measurement in which a survey map is formed by successively connecting survey map sections to each other, each survey map section is produced based on a set of pictures photographed for the measurement. Plural frames of image data are read from a memory in a predetermined order. A monitor displays a scene including a first display area and a second display area. Respective plural pictures are displayed on first display area based on the plural frames of image data read from the memory. A displayed picture can be optionally transferred from the first display area to the second display area. The transferred picture can be optionally returned to the first display area. The pictures displayed on the first display area are rearranged by the transfer of pictures between the first and second display areas such that pictures forming each set for producing a survey map section are capable of being visually recognized.


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