Kure, Japan

Toshihiko Kajihara

This inventor holds 3 USPTO granted patents. Top assignee: Mitutoyo Corporation. Active years: 2019-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshihiko Kajihara. Retrieved from https://idiyas.com/inventor/toshihiko-kajihara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.6

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2019-2025

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3 patents (USPTO):Explore Patents

Title: The Innovations of Toshihiko Kajihara

Introduction

Toshihiko Kajihara is a notable inventor based in Kure, Japan. He has made significant contributions to the field of surface measurement technology, holding a total of three patents. His work is recognized for its innovative approach to enhancing measurement devices.

Latest Patents

Kajihara's latest patents include a surface roughness measuring device and a surface texture measuring apparatus. The surface texture measuring apparatus is designed for easy and safe replacement of measurement devices. It features a mechanism that allows for the attachment and detachment of the measurement device to and from a drive mechanism part. The apparatus includes a bracket with a first connector for signal transmission and a support frame with a second connector. This design enables hot-swappable insertion and removal, enhancing the efficiency of the measurement process.

Career Highlights

Toshihiko Kajihara is associated with Mitutoyo Corporation, a leading company in precision measurement instruments. His work at Mitutoyo has been instrumental in advancing measurement technologies, particularly in surface texture analysis.

Collaborations

Kajihara has collaborated with notable coworkers, including Futoshi Doi and Yu Sugai. Their combined expertise has contributed to the development of innovative measurement solutions.

Conclusion

Toshihiko Kajihara's contributions to the field of surface measurement technology exemplify the spirit of innovation. His patents reflect a commitment to improving measurement accuracy and efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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