Toshihide Dohi

Title: Toshihide Dohi: Innovator in Precision Measurement and Projection Technology

Introduction

Toshihide Dohi is a notable inventor based in Minoo, Japan. He has made significant contributions to the fields of precision measurement and projection technology. With a total of 2 patents, Dohi's work reflects a commitment to advancing technological capabilities.

Latest Patents

Dohi's latest patents include an interferometer designed for measuring the surface configuration of test objects with high precision. This interferometer utilizes interference to allow accurate positioning at a predetermined measuring position. It features an alignment pattern that generates a wave front converging at the measuring position, enabling precise measurement of the test surface configuration.

Another significant patent is for a reduction-type projection exposure apparatus. This apparatus incorporates a spatial filter with a predetermined complex amplitude-transmission distribution, strategically placed at the pupil position of the projection lens. The design prevents light absorption, thereby avoiding thermal damage and ensuring excellent resolution and depth of focus.

Career Highlights

Throughout his career, Toshihide Dohi has worked with prominent companies such as Hitachi, Ltd. and Minolta Company, Ltd. His experience in these organizations has contributed to his expertise in developing innovative technologies.

Collaborations

Dohi has collaborated with notable individuals in his field, including Hiroshi Fukuda and Kiyofumi Hashimoto. These collaborations have likely enriched his work and led to advancements in his projects.

Conclusion

Toshihide Dohi's contributions to precision measurement and projection technology highlight his innovative spirit and dedication to advancing these fields. His patents reflect a deep understanding of complex systems and a commitment to excellence in engineering.