This inventor holds 2 USPTO granted patents. Top assignees: Shibaura Machine Co., Ltd., Toshiba Kikai Kabushiki Kaisha. Active years: 1997-2026.
Company Filing History:
Years Active: 1997-2026
Title: Toshiaki Katahira: Innovator in Layer Thickness Measurement
Introduction
Toshiaki Katahira is a notable inventor based in Numazu, Japan. He has made significant contributions to the field of measurement technology, particularly in the area of layer thickness measurement. His innovative approach has led to the development of a unique method that enhances the accuracy of measuring coated layers.
Latest Patents
Katahira holds a patent for a "Method and apparatus for measuring the thickness of layers coated on." This patent describes a method for measuring the thicknesses of each layer coated on both surfaces of a base material. The process involves measuring distances using displacement meters and calculating the thickness of the layers with precision. His invention simplifies the measurement process and improves the reliability of the results.
Career Highlights
Toshiaki Katahira is associated with Toshiba Kikai Kabushiki Kaisha, a company known for its advancements in technology and engineering. His work at Toshiba has allowed him to focus on innovative solutions that address real-world challenges in measurement techniques. With a patent portfolio that includes 1 patent, Katahira continues to push the boundaries of what is possible in his field.
Collaborations
Katahira has collaborated with Satoru Nitta, a fellow innovator, to further enhance the development of measurement technologies. Their partnership exemplifies the spirit of teamwork in the pursuit of innovation.
Conclusion
Toshiaki Katahira's contributions to layer thickness measurement demonstrate his commitment to innovation and excellence. His patented method not only advances measurement technology but also sets a standard for future developments in the field.