The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 1997
Filed:
Oct. 30, 1995
Toshiaki Katahira, Numazu, JP;
Satoru Nitta, Numazu, JP;
Toshiba Kikai Kabushiki Kaisha, Tokyo, JP;
Abstract
A method of measuring the thicknesses of each layer coated on the both surfaces of the base material, which includes the steps of: measuring simultaneously a first distance between a first displacement meter and the surface of the layer coated on the one surface of the base material, a second distance between a second displacement meter and the surface of the layer coated on the other surface of the base material, and a third distance between a third displacement meter and the one surface of the base material; calculating a thickness (Ta) of the layer coated on the one surface of the base material by subtracting the value (Da) measured by the first displacement meter from the value (Dc) measured by the third displacement miter; calculating a whole thickness (T) of the coated sheet from the value (Da) measured by the first displacement meter and the value (Db) measured by the second displacement meter; and calculating a thickness (Tb) of the layer coated on the other surface of the base material by subtracting the thickness (Tc) of the base material and the thickness (Ta) of the layer coated on the one surface of the base material from the whole thickness (T).