This inventor holds 2 USPTO granted patents. Top assignee: Tokyo Electron Limited. Active years: 2002-2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002-2010
Title: Toshiaki Akasaka: Innovator in Electrical Characteristics Inspection
Introduction
Toshiaki Akasaka is a prominent inventor based in Nirasaki, Japan. He has made significant contributions to the field of electrical characteristics inspection, holding a total of 2 patents. His work focuses on improving methods for inspecting chips and enhancing data communication systems.
Latest Patents
Akasaka's latest patents include a method for inspecting electrical characteristics of chips and a storage medium for storing a program of the method. This innovative inspecting method involves registering a pre-obtained relationship between the contact time of probes with a target object at a predetermined temperature and the varying tip positions of the probes. The method allows for the inspection of multiple chips simultaneously by estimating and correcting the tip positions of the probes based on the established relationship and contact time.
Another notable patent is a data communication method and system. This method entails transmitting measurement data necessary for assessing the electrical characteristics of multiple objects from a probing apparatus to a tester before conducting tests. It also includes the transmission of measurement result data from the tester back to the probing apparatus after the electrical characteristics have been measured.
Career Highlights
Akasaka is currently employed at Tokyo Electron Limited, a leading company in the semiconductor industry. His work at the company has allowed him to develop and refine his innovative methods, contributing to advancements in chip inspection technology.
Collaborations
Akasaka collaborates with Hideaki Tanaka, a fellow innovator in the field. Their partnership has fostered a productive environment for developing cutting-edge technologies in electrical characteristics inspection.
Conclusion
Toshiaki Akasaka's contributions to the field of electrical characteristics inspection through his innovative patents have significantly advanced the technology used in chip testing. His work continues to influence the industry and improve the efficiency of data communication systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile