Location History:
- Yamato, JP (1981 - 1986)
- Ninomiya, JP (1986)
- Kanagawa, JP (1987 - 1995)
- Ninomiya-machi, JP (2000 - 2001)
- Kanagawa-ken, JP (1997 - 2009)
- Naka-gun, JP (1998 - 2009)
Company Filing History:
35 out of 52,711 
8 out of 2,916 
7 out of 1,033 
Years Active: 1981-2009
Certainly! Here's the article on inventor Toru Tojo:
Title: Innovator Spotlight - Toru Tojo: Advancing Pattern Inspection Technology
Introduction: Toru Tojo, a prolific inventor based in Naka-gun, Japan, has made significant contributions to the field of pattern inspection with a remarkable portfolio of 47 patents. His innovative work has revolutionized the way defects are detected in images, enhancing efficiency and accuracy in various industries.
Latest Patents:
1. Pattern inspecting method: Tojo's latest invention focuses on enabling swift detection of defects such as pixel positional deviation, expansion/contraction noise, or sensing noise in images. By establishing a mathematical model through the comparison of inspection reference pattern images and pattern images to be inspected, this method efficiently identifies and alerts to any defects present.
2. Pattern inspection apparatus: This cutting-edge apparatus utilizes a die-to-database comparison method, coupled with a die-to-die comparison method, to analyze pattern data from optical images against reference pattern data. By automating the detection of repeated pattern areas, Tojo's invention streamlines the inspection process and improves overall accuracy.
Career Highlights: Toru Tojo has held pivotal roles at renowned companies such as Toshiba Corporation and Tokyo Shibaura Denki Corporation (Toshiba). Through his tenure, he has consistently demonstrated a passion for innovation and a commitment to pushing the boundaries of technology in pattern inspection.
Collaborations: Throughout his career, Tojo has collaborated closely with industry experts such as Mitsuo Tabata and Toshiyuki Watanabe. Together, they have combined their expertise to develop cutting-edge solutions that have reshaped the landscape of pattern inspection technology.
Conclusion: Toru Tojo's exceptional work in advancing pattern inspection methodologies has not only enhanced the efficiency of defect detection processes but has also paved the way for future innovations in the field. His dedication to precision and excellence continues to inspire and drive progress within the industry.
I hope you find this article insightful and informative! If you need further details or have any more requests, feel free to ask.
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