Tooru Kurenuma

Title: Tooru Kurenuma: Innovator in Probe Technology

Introduction

Tooru Kurenuma is a notable inventor based in Tsuchiura, Japan. He has made significant contributions to the field of probe technology, holding a total of six patents. His innovative work focuses on enhancing the performance and accuracy of scanning probe microscopes.

Latest Patents

Kurenuma's latest patents include a probe manufacturing method, a probe, and a scanning probe microscope. The probe manufacturing method involves attaching a carbon nanotube to a mounting base end, which effectively eliminates the effects of a carbon contamination film. This method increases the bonding strength and conductivity of the probe by coating the entire circumference of the nanotube and the base with a coating film. The mounting process is performed under microscopic observation, ensuring precision. Additionally, his scanning probe microscope patent details a probe tip movement control method that allows for high measurement accuracy. This method utilizes X-, Y-, and Z-fine movement mechanisms to adjust the positions of the probe tip and sample, enabling effective scanning of uneven surfaces.

Career Highlights

Throughout his career, Kurenuma has worked with prominent companies such as Hitachi Construction Machinery Co., Ltd. and Hitachi Kenki Fine Tech Co., Ltd. His experience in these organizations has contributed to his expertise in probe technology and innovation.

Collaborations

Kurenuma has collaborated with notable coworkers, including Yoshiyuki Nagano and Ken Murayama. Their combined efforts have further advanced the field of probe technology.

Conclusion

Tooru Kurenuma's contributions to probe technology and his innovative patents have significantly impacted the field. His work continues to inspire advancements in scanning probe microscopy and related technologies.