Jena, Germany

Toni Eichelkraut

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Carl Zeiss Microscopy Gmbh. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toni Eichelkraut. Retrieved from https://idiyas.com/inventor/toni-eichelkraut

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2023

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Toni Eichelkraut: Innovator in Optical Device Calibration

Introduction

Toni Eichelkraut is a notable inventor based in Jena, Germany. He has made significant contributions to the field of optical devices, particularly in the calibration of phase masks. His innovative approach has led to advancements that enhance the functionality and accuracy of optical systems.

Latest Patents

Eichelkraut holds a patent for a "Method for calibrating a phase mask and microscope." This method involves actuating a phase mask with various grey level patterns, measuring the intensity of light downstream of the phase mask, and establishing a relationship between the grey levels and phase shifts. This calibration process is crucial for improving the performance of optical devices.

Career Highlights

Toni Eichelkraut is associated with Carl Zeiss Microscopy GmbH, a leading company in the field of microscopy and optical technologies. His work at this esteemed organization has allowed him to collaborate with other experts in the field, including his coworker Jörg Siebenmorgen.

Collaborations

Due to space constraints, the details of collaborations will not be included.

Conclusion

Toni Eichelkraut's contributions to optical device calibration exemplify the importance of innovation in technology. His patent and work at Carl Zeiss Microscopy GmbH highlight his role as a key figure in advancing optical systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…