This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Northeastern University. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Innovations by Tongkang Zhang in Product Quality Detection
Introduction
Tongkang Zhang is an accomplished inventor based in Shenyang, China. He has made significant contributions to the field of product quality detection, particularly in complex industrial processes. His innovative approach combines prior knowledge with advanced detection methods to enhance product quality.
Latest Patents
Tongkang Zhang holds a patent for a "Product quality detection method in complex industrial process fusing prior knowledge." This invention provides a method for detecting product quality by acquiring related data from product production in complex industrial processes. The samples are preprocessed to construct a training data set, which is then used to train a product quality detection model. This model utilizes a multi-scale feature extraction network and a multi-process feature fusion method to achieve more accurate feature representation, ultimately increasing production benefits. He has 1 patent to his name.
Career Highlights
Tongkang Zhang is affiliated with Northeastern University, where he continues to advance his research and innovations. His work focuses on improving the efficiency and accuracy of product quality detection in various industrial applications.
Collaborations
He has collaborated with notable colleagues, including Jinliang Ding and Jun Lu, to further enhance the impact of his research and innovations.
Conclusion
Tongkang Zhang's contributions to product quality detection exemplify the importance of innovation in industrial processes. His work not only improves product quality but also enhances production efficiency, showcasing the potential of combining prior knowledge with advanced detection methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
