The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
Apr. 01, 2025
Northeastern University, Shenyang, CN;
Jinliang Ding, Shenyang, CN;
Datong Li, Shenyang, CN;
Tongkang Zhang, Shenyang, CN;
Jun Lu, Shenyang, CN;
NORTHEASTERN UNIVERSITY, Shenyang, CN;
Abstract
Provided is a product quality detection method in a complex industrial process fusing prior knowledge. Related data of product production in the complex industrial process is acquired to serve as samples; The acquired samples are preprocessed and a training data set is constructed by the preprocessed samples; a product quality detection model in the complex industrial process fusing prior knowledge is constructed; the product quality detection model is trained by the training data set; and the trained quality detection model is used for product quality detection to obtain product quality. The present invention designs that feature extraction on multiple scales is supported by a multi-scale feature extraction network with convolutional kernels with different sizes, and designs that the extracted features of each process are fused by a multi-process feature fusion method of the prior knowledge, thereby obtaining more accurate feature representation and increasing the production benefit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile