Shenyang, China

Jun Lu

This inventor holds 1 USPTO granted patent. Top assignee: Northeastern University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jun Lu. Retrieved from https://idiyas.com/inventor/jun-lu-j9sacwg6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Jun Lu in Product Quality Detection

Introduction

Jun Lu is a prominent inventor based in Shenyang, China. He has made significant contributions to the field of product quality detection, particularly in complex industrial processes. His innovative approach combines prior knowledge with advanced detection methods to enhance product quality.

Latest Patents

Jun Lu holds a patent for a "Product quality detection method in complex industrial process fusing prior knowledge." This invention provides a method for detecting product quality by acquiring related data from the production process. The samples are preprocessed to construct a training data set, which is then used to train a product quality detection model. This model utilizes a multi-scale feature extraction network and a multi-process feature fusion method to achieve more accurate feature representation, ultimately increasing production benefits. He has 1 patent to his name.

Career Highlights

Jun Lu is affiliated with Northeastern University, where he continues to engage in research and development in the field of industrial processes. His work has been instrumental in advancing methodologies that improve product quality detection.

Collaborations

Jun Lu has collaborated with notable colleagues, including Jinliang Ding and Tongkang Zhang. Their combined expertise contributes to the innovative research and development efforts at Northeastern University.

Conclusion

Jun Lu's contributions to product quality detection through his innovative patent demonstrate his commitment to enhancing industrial processes. His work not only improves product quality but also benefits the overall production efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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