Company Filing History:
Years Active: 2014-2024
Title: Tomoyuki Iwata: Innovator in Scattering Measurement Technologies
Introduction
Tomoyuki Iwata is a notable inventor based in Hamura-shi, Japan. He has made significant contributions to the field of scattering measurement analysis, holding a total of 2 patents. His work focuses on developing advanced methods and devices that enhance the accuracy and efficiency of scattering measurements.
Latest Patents
Iwata's latest patents include a scattering measurement analysis method and device, as well as a non-transitory computer-readable storage medium that stores a scattering measurement analysis program. The scattering measurement analysis method involves obtaining a theoretical scattering intensity from a structural model containing multiple scatterers. This process includes calculating contributions from pairs of scatterers based on their distance and respective scattering factors. Additionally, his X-ray stress measurement apparatus integrates various components, such as a camera, X-ray source, and detector, to measure stress in samples accurately.
Career Highlights
Tomoyuki Iwata is currently employed at Rigaku Corporation, where he continues to innovate in the field of measurement technologies. His work has been instrumental in advancing the capabilities of X-ray stress measurement and scattering analysis.
Collaborations
Iwata collaborates with esteemed colleagues, including Shoichi Yasukawa and Kazuhiko Omote, who contribute to his research and development efforts.
Conclusion
Tomoyuki Iwata's contributions to scattering measurement technologies exemplify his dedication to innovation and excellence in his field. His patents and ongoing work at Rigaku Corporation highlight his role as a leading inventor in Japan.