This inventor holds 1 USPTO granted patent. Top assignee: Kawasaki Jukogyo Kabushiki Kaisha. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Tomoya Nakanishi: Inventor of a Specimen Testing System.
Introduction
Tomoya Nakanishi is an inventor based in Kakamigahara, Japan. His patent work includes a testing system designed to collect and measure specimens.
Latest Patents
Nakanishi is associated with 1 patent, titled “Testing system.” The invention describes a system that collects a specimen from a subject and measures it for testing. It includes a box in which at least one of the following processes can take place: specimen collection and receipt, preprocessing before measurement, or measurement of the preprocessed specimen.
Career Highlights
Nakanishi is associated with Kawasaki Jukogyo Kabushiki Kaisha. His patent reflects work on integrating specimen collection, preparation, and measurement within a testing system.
Collaborations
His listed coworkers include Yasuhiko Hashimoto and Yukio Iwasaki.
Conclusion
Tomoya Nakanishi’s patent focuses on a system that brings key stages of specimen testing together, from collection and preprocessing to measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile