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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12678779 B1

PDFFull Text
Date of Patent:
Jul. 14, 2026

Filed:

Jun. 01, 2021

Testing system

Applicant:

Kawasaki Jukogyo Kabushiki Kaisha, Kobe, JP;

Inventors:

Yasuhiko Hashimoto, Kobe, JP;

Yukio Iwasaki, Kobe, JP;

Atsushi Kameyama, Kakogawa, JP;

Toshihiko Miyazaki, Kobe, JP;

Shogo Kubota, Kobe, JP;

Satoshi Ouchi, Kobe, JP;

Eiji Mitsui, Kobe, JP;

Tatsuya Shirai, Kakamigahara, JP;

Hiroshi Mitsui, Kakamigahara, JP;

Tomoya Nakanishi, Kakamigahara, JP;

Assignee:

KAWASAKI JUKOGYO KABUSHIKI KAISHA, Kobe, JP;

Attorneys:

METROLEX IP LAW GROUP, PLLC

Robert L. Scott, Esq.

Primary Examiner:

Benjamin R Whatley

Int. Cl.
CPC ...
G01N 35/04 (2006.01); A61B 10/00 (2006.01); A61G 10/00 (2006.01); A61L 2/10 (2006.01); A61L 2/26 (2006.01); B01L 1/00 (2006.01); B01L 1/02 (2006.01); B01L 1/04 (2006.01); B01L 3/00 (2006.01); B25J 19/02 (2006.01); G01N 35/00 (2006.01); G01N 35/10 (2006.01); B25J 21/00 (2006.01);
U.S. Cl.
CPC ...
B01L 1/52 (2019.08); A61B 10/0051 (2013.01); A61G 10/00 (2013.01); A61G 10/005 (2013.01); A61L 2/10 (2013.01); A61L 2/26 (2013.01); B01L 1/025 (2013.01); B01L 1/04 (2013.01); B01L 3/502 (2013.01); B25J 19/02 (2013.01); G01N 35/00 (2013.01); G01N 35/0099 (2013.01); G01N 35/04 (2013.01); G01N 35/1002 (2013.01); A61L 2202/11 (2013.01); B01L 2200/025 (2013.01); B01L 2300/042 (2013.01); B01L 2300/046 (2013.01); B01L 2300/0609 (2013.01); B01L 2300/0829 (2013.01); B25J 21/00 (2013.01); G01N 2035/00306 (2013.01); G01N 2035/00326 (2013.01);
Abstract

A testing system collects a specimen from a subject and measures the collected specimen to test the specimen, and includes a box to allow at least one of specimen collection for collecting and receiving the specimen, preprocessing for processing the collected specimen before measurement, or specimen measurement for measuring the preprocessed specimen to be performed therein.

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