Hyogo, Japan

Tomoki Tamada

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Denki Kabushiki Kaisha. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tomoki Tamada. Retrieved from https://idiyas.com/inventor/tomoki-tamada-1ee5fwox

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: The Innovations of Tomoki Tamada

Introduction

Tomoki Tamada is a notable inventor based in Hyogo, Japan. He has made significant contributions to the field of quality management systems. His innovative approach has led to the development of a patented technology that enhances efficiency in identifying defects.

Latest Patents

Tomoki Tamada holds a patent for a quality management system and recording medium. This system comprises several components, including a data processing unit, a processed-data judgment unit, a sampling unit, and a file making unit. The design allows for a reduction in labor and time from the detection of a defect to the recognition of an abnormal condition. Additionally, it improves the accuracy of the fatality rate of defects, showcasing Tamada's commitment to advancing quality management practices.

Career Highlights

Tamada is currently employed at Mitsubishi Electric Corporation, where he continues to innovate and develop new technologies. His work has been instrumental in enhancing the company's reputation for quality and reliability in its products.

Collaborations

Some of his notable coworkers include Nobuyoshi Hattori and Kaoru Yamana. Their collaborative efforts contribute to the innovative environment at Mitsubishi Electric Corporation.

Conclusion

Tomoki Tamada's contributions to quality management systems exemplify the impact of innovation in technology. His patented work not only streamlines processes but also enhances the accuracy of defect recognition.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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