The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Jul. 28, 1998
Applicant:
Inventors:
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract
A quality management system (S,) comprises a data processing unit (,), a processed-data judgment unit (,) receiving an output from the data processing unit (,), a sampling unit (,) receiving an output from the processed-data judgment unit (,), a file making unit (,) receiving an output from the sampling unit (,), a data processing unit (,) receiving an output from an observation unit (,) and a processed-data judgment unit (,) receiving an output from the data processing unit (,). The system (S,) having this constitution allows reduction in labor and time from finding of a defect to recognition of occurrence of abnormal condition and improvement in accuracy of fatality rate of the defect.