This inventor holds 1 USPTO granted patent and 11 published patent applications. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: Tomohisa Sezaki: Innovator in Scan Test Technology
Introduction
Tomohisa Sezaki is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of electronic testing through his innovative patent. His work primarily focuses on enhancing the efficiency and effectiveness of scan test circuits.
Latest Patents
Sezaki holds a patent for a "Scan test control method and scan test circuit." This invention features a scan chain with multiple scan storage elements, a scan clock generation circuit that independently controls the frequency of two clocks, and a scan selection internal signal generation circuit. This technology aims to improve the process of shifting data and performing operations within electronic devices.
Career Highlights
Tomohisa Sezaki is associated with Matsushita Electric Industrial Co., Ltd., a leading company in the electronics industry. His role at the company has allowed him to develop and refine his innovative ideas, contributing to advancements in electronic testing methodologies.
Collaborations
Sezaki has worked alongside talented colleagues, including Toshinobu Nakao and Shinji Ozaki. Their collaborative efforts have fostered an environment of innovation and creativity within their projects.
Conclusion
Tomohisa Sezaki's contributions to scan test technology exemplify the impact of innovation in the electronics field. His patent reflects a commitment to improving electronic testing processes, showcasing his role as a significant inventor in this domain.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile